Advanced Test Methods for SRAMs

Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

By Alberto Bosio , Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch , Arnaud Virazel

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Valuable testing and diagnostic methods for the latest generation of static random access memory (SRAM), are presented in this comprehensive guide. New fault models are required for the latest very deep sub-micron (VDSM) technologies, and are outlined here.

Full Description

  • ISBN13: 978-1-4419-0937-4
  • 186 Pages
  • Publication Date: November 4, 2009
  • Available eBook Formats: PDF
  • eBook Price: $129.00
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Full Description
Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called 'static faults,' but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as 'dynamic faults', are not covered by classical test solutions and require the dedicated test sequences presented in this book.
Table of Contents

Table of Contents

  1. Introduction.
  2. Basics on SRAM Memory Testing.
  3. Resistive
  4. Open Defects in Core
  5. Cells.
  6. Open Defects in Pre
  7. Charge Circuits.
  8. Resistive
  9. Open Defects in Address Decoders.
  10. Resistive
  11. Open Defects in Write Drivers.
  12. Resistive
  13. Open Defects in Sense Amplifiers.
  14. Faults due to Process Variations in SRAMs.
  15. Diagnosis of Dynamic Faults.
  16. Conclusion.
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