Advanced Test Methods for SRAMs

Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

Authors: Bosio, A., Dilillo, L., Girard, P., Pravossoudovitch, S., Virazel, A.

  • First book to present complete, state-of-the-art coverage of dynamic fault memory testing
  • Presents content using a "bottom-up" approach, from the electrical causes of malfunction up to the generation of smart test strategies
  • Includes case studies covering all memory components (core-cells, address decoders, write drivers, sense amplifiers, etc.)
  • Includes Spice simulation files and an SRAM logic fault simulator
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eBook $109.00
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  • ISBN 978-1-4419-0938-1
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Hardcover $149.00
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  • ISBN 978-1-4419-0937-4
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Softcover $149.00
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  • ISBN 978-1-4899-8314-5
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About this book

Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

by:

Alberto Bosio

Luigi Dilillo

Patrick Girard

Serge Pravossoudovitch

Arnaud Virazel

Modern electronics depends on nanoscaled technologies that present new challenges in terms of testing and diagnosis. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnosis of the latest generation of SRAM, one of the most widely used type of memories. Classical methods for testing memory are designed to handle the so-called "static faults", but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new faults, referred to as "dynamic faults", are not covered by classical algorithms and require the dedicated test and diagnosis solutions presented in this book.

  • First book to present complete, state-of-the-art coverage of dynamic fault testing for SRAM memories;
  • Presents content using a "bottom-up" approach, from the study of the electrical causes of malfunctions up to the generation of smart test strategies;
  • Includes case studies covering all memory components (core-cells, address decoders, write drivers, sense amplifiers, etc.);
  • Proposes an exhaustive analysis of resistive-open defects in each memory component and the resulting dynamic fault modeling.

Table of contents (8 chapters)

  • Basics on SRAM Testing

    Girard, Patrick (et al.)

    Pages 1-19

  • Resistive-Open Defects in Core-Cells

    Girard, Patrick (et al.)

    Pages 21-48

  • Resistive-Open Defects in Pre-charge Circuits

    Girard, Patrick (et al.)

    Pages 49-64

  • Resistive-Open Defects in Address Decoders

    Girard, Patrick (et al.)

    Pages 65-80

  • Resistive-Open Defects in Write Drivers

    Girard, Patrick (et al.)

    Pages 81-97

Buy this book

eBook $109.00
price for USA
  • ISBN 978-1-4419-0938-1
  • Digitally watermarked, DRM-free
  • Included format: EPUB, PDF
  • ebooks can be used on all reading devices
  • Download immediately after purchase
Hardcover $149.00
price for USA
  • ISBN 978-1-4419-0937-4
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
Softcover $149.00
price for USA
  • ISBN 978-1-4899-8314-5
  • Free shipping for individuals worldwide
  • Usually dispatched within 3 to 5 business days.
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Bibliographic Information

Bibliographic Information
Book Title
Advanced Test Methods for SRAMs
Book Subtitle
Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Authors
Copyright
2010
Publisher
Springer US
Copyright Holder
Springer-Verlag US
eBook ISBN
978-1-4419-0938-1
DOI
10.1007/978-1-4419-0938-1
Hardcover ISBN
978-1-4419-0937-4
Softcover ISBN
978-1-4899-8314-5
Edition Number
1
Number of Pages
XV, 171
Topics