Overview
- Provides straightforward description focusing on imaging of TEM and STEM
- Includes appendices and exercises useful for graduate students
- Covers recent advancement of TEM and STEM
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Keywords
- Nanometer-sized Objects
- High-resolution Electron Microscopy
- Transmission Electron Microscopy (TEM)
- Scanning Transmission Electron Microscopy (STEM)
- Annular Dark Field (ADF) STEM
- Annular Bright Field (ABF) STEM
- Differential Phase Contrast (DPC) STEM
- Image Contrast of TEM and STEM
- Electron Nano-diffraction
- Electron-energy Loss Spectroscopy (EELS)
- Energy-filtered TEM (EFTEM)
- Lattice-fringe Imaging in TEM
- Structure Image in TEM
- Contrast Transfer Function (CTF)
- Image Simulation
- Continuous or Pulsed Electron Sources
- Aberration Corrector
- Monochromator
- Sparse-coding Image Processing
About this book
In this second edition, most chapters of the first edition, which published in 2017, have been revised and recent advancement of electron microscopy such as differential phase contrast (DPC) STEM, sparse-coding image processing and quantum electron microscopy have been supplemented with further details. This book explains the basis of imaging and diffraction in transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) in the style of a textbook. The book focuses on the explanation of electron microscopic imaging of TEM and STEM without including in the main text distracting information on basic knowledge of crystal diffraction, wave optics, electron lens, and scattering and diffraction theories, which are explained separately in the appendices. The comprehensive explanation is provided on the basis of Fourier transform theory, and this approach is unique in comparison with other advanced resources on high-resolution electron microscopy. With the present textbook, readers are led to understand the essence of the imaging theories of TEM and STEM without being diverted by various kinds of knowledge around electron microscopy. The up-to-date information in this book, particularly on imaging details of STEM and aberration corrections, is valuable worldwide for today’s graduate students and professionals just starting their careers.
Authors and Affiliations
About the author
Dr. Nobuo Tanaka is a designated professor of Institute of Materials and Systems for Sustainability (IMaSS) of Nagoya University and an adjunct senior researcher of Japan Fine Ceramic Center (JFCC). He received a Ph.D. degree from Applied Physics Department of Nagoya University in 1978 and became an assistant professor of the department. He stayed Arizona State University as a visiting scholar to study with the late Prof. J. Cowley from 1983 to 1985. He was appointed a full professor of Applied Physics of Nagoya University in 1999 through an associate professor. In 2001, he moved to Center of Integrated Research for Science and Engineering (CIRSE) of Nagoya University, which was renamed EcoTopia Science Institute (ESI) in 2004 and IMaSS in 2015. He was the director of the institute from 2012 to 2015. He was also the president of Japanese Microscopy Society (JSM) from 2015 to 2017.
Bibliographic Information
Book Title: Electron Nano-ïmaging
Book Subtitle: Basics of Imaging and Diffraction for TEM and STEM
Authors: Nobuo Tanaka
Publisher: Springer Tokyo
eBook Packages: Chemistry and Materials Science, Chemistry and Material Science (R0)
Copyright Information: The Editor(s) (if applicable) and The Author(s), under exclusive license to Springer Nature Japan KK 2024
Hardcover ISBN: 978-4-431-56939-8Due: 07 July 2024
eBook ISBN: 978-4-431-56940-4Due: 07 July 2024
Edition Number: 2
Number of Pages: XXX, 384
Number of Illustrations: 128 b/w illustrations, 14 illustrations in colour