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New & Forthcoming Titles | Statistics for Industry, Technology, and Engineering

Statistics for Industry, Technology, and Engineering

Statistics for Industry, Technology, and Engineering

Series Ed.: Steinberg, David

ISSN: 2662-5555

The Statistics for Industry, Technology, and Engineering series will present up-to-date statistical ideas and methods that are relevant to researchers and accessible to an interdisciplinary audience: carefully organized authoritative presentations, numerous illustrative examples based on current practice, reliable methods, realistic data sets, and discussions of select new emerging methods and their application potential.  Publications will appeal to a broad interdisciplinary readership including both researchers and practitioners in applied statistics, data science, industrial statistics, engineering statistics, quality control, manufacturing, applied reliability, and general quality improvement methods.

Principal Topic Areas:

* Quality Monitoring * Engineering Statistics * Data Analytics * Data Science * Time Series with Applications * Systems Analytics and Control * Stochastics and Simulation * Reliability * Risk Analysis * Uncertainty Quantification * Decision Theory * Survival Analysis * Prediction and Tolerance Analysis * Multivariate Statistical Methods * Nondestructive Testing * Accelerated Testing * Signal Processing * Experimental Design * Software Reliability * Neural Networks *

The series will include professional expository monographs, advanced textbooks, handbooks, general references, thematic compilations of applications/case studies, and carefully edited survey books.

Series Editor: David Steinberg, Tel Aviv University, Israel

Editorial Advisory Board:

V. Roshan Joseph, Georgia Institute of Technology, USA

Ron S. Kenett, KPA Ltd, University of Turin, Italy; Neaman Institute, Technion, Israel

Christine M. Anderson-Cook, Los Alamos National Laboratory, New Mexico, USA

Bradley Jones, JMP Division, SAS Institute, North Carolina, USA

Fugee Tsung, Hong Kong University of Science and Technology, Hong Kong