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  • © 1995

Forces in Scanning Probe Methods

Part of the book series: NATO Science Series E: (NSSE, volume 286)

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Table of contents (59 chapters)

  1. Front Matter

    Pages i-xiii
  2. Introduction to Scanning Probe Methods

  3. Instrumentation

    1. Scanning Probe Microscopy Instrumentation

      • Othmar Marti, Jaime Colchero
      Pages 15-34
    2. Low Temperature Scanning Force Microscopy

      • H. J. Hug, A. Moser, O. Fritz, B. Stiefel, I. Parashikov
      Pages 35-62
    3. Effect of Overlayer Thickness on the Nanoindentation of SiO2 /Si

      • Charles F. Draper, David M. Schaefer, Richard J. Colton, Steven M. Hues
      Pages 85-90
    4. Nanostethoscopy: A New Mode of Operation of the Atomic Force Microscope

      • A. Keaton, J. F. Holzrichter, R. Balhorn, W. J. Siekhaus
      Pages 91-97
    5. A Multi-Test Instrument Based on Scanning Probe Technologies

      • L. McDonnell, M. Phelan, E. M. Cashell
      Pages 99-104
    6. Imaging Local Electric Forces in Organic Thin Films by Scanning Maxwell Stress Microscopy

      • Takahito Inoue, Mark J. Jeffery, Hiroshi Yokoyama
      Pages 113-118
    7. Simultaneous AFM and Local Conductivity Imaging

      • A. Kulik, C. Wüthrich, G. Gremaud, G. A. D. Briggs
      Pages 119-122
    8. Micromechanical Heat Sensor: Observation of a Chemical Reaction, Photon and Electrical Heat Pulses

      • J. K. Gimzewski, Ch. Gerber, E. Meyer, R. R. Schlittler
      Pages 123-131
  4. Theory

    1. Forces in Scanning Probe Microscopy

      • S. Ciraci
      Pages 133-147
    2. Controlled Motion of Xe Atom on Metal Surfaces

      • A. Buldum, S. Ciraci, Ş. Erkoç
      Pages 149-155
    3. Atomistic Theory of the Interaction Between AFM Tips and Ionic Surfaces

      • A. L. Shluger, A. L. Rohl, D. H. Gay, R. T. Williams
      Pages 169-174
    4. Molecular Dynamics Simulation of Atomic-Scale Adhesion, Deformation, Friction, and Modification of Diamond Surfaces

      • J. A. Harrison, S. B. Sinnott, C. T. White, D. W. Brenner, R. J. Colton
      Pages 175-181
    5. Simulation of SFM Images of Adsorbed C 60 and C 70 Molecules

      • Christian Girard, Michel Devel, Alain Dereux, Christian Joachim
      Pages 183-189

Editors and Affiliations

  • Institute of Physics, University of Basel, Basel, Switzerland

    H. J. Güntherodt, E. Meyer

  • Ciba Geigy Ltd., Central Research Services Physics, Basel, Switzerland

    D. Anselmetti

Bibliographic Information

Buy it now

Buying options

eBook USD 259.00
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book USD 329.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book USD 329.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Other ways to access