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Advances in X-Ray Analysis

Volume 36

Editors: Gilfrich, J.V., Huang, T.C., Hubbard, C.R., James, M.R., Jenkins, R., Lachance, G.R., Smith, D.K. (Eds.)

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  • ISBN 978-1-4613-6293-7
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About this book

The 41st Annual Conference on Applications of X-Ray Analysis was held August 3-7, 1992, at the Sheraton Colorado Springs Hotel, Colorado Springs, Colorado. The Conference is recognized to be a major event in the x-ray analysis field, bringing together scientists and engineers from around the world to discuss the state of the art in x-ray applications as well as indications for further developments. In recent years, one of the most exciting and important developments in the x-ray field has been the applications of grazing-incidence x-rays for surface and thin-film analysis. To introduce the conference attendees to these "leading-edge" developments, the topic for the Plenary Session was "Grazing-Incidence X­ Ray Characterization of Materials. " The Conference had the privilege of inviting leading experts in the field of x-ray thin film analysis to deliver lectures at the Plenary Session. Dr. D. K. Bowen, University of Warwick, U. K. , opened the session with a lecture on "Grazing Incidence X-Ray Scattering from Thin Films. " He reviewed and compared grazing incidence diffraction, fluorescence and reflectivity techniques. Results of experimental and theoretical analysis were also discussed. Dr. B. Lenge1er, Forchungszentrum Ju1ich, Germany, followed with a lecture on "Grazing Incidence Diffuse X-Ray Scattering from Thin Films. " He concentrated on the use of newly developed "off-specular" reflectivity techniques for the determination of vertical roughness, lateral correlation length and contour exponent on surfaces.

Buy this book

Softcover $79.99
price for USA
  • ISBN 978-1-4613-6293-7
  • Free shipping for individuals worldwide
  • Immediate ebook access, if available*, with your print order
  • Usually dispatched within 3 to 5 business days.

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Bibliographic Information

Bibliographic Information
Book Title
Advances in X-Ray Analysis
Book Subtitle
Volume 36
Editors
  • John V. Gilfrich
  • Ting C. Huang
  • C.R. Hubbard
  • M.R. James
  • Ron Jenkins
  • G.R. Lachance
  • Deane K. Smith
Copyright
1993
Publisher
Springer US
Copyright Holder
Springer Science+Business Media New York
Softcover ISBN
978-1-4613-6293-7
Edition Number
1
Number of Pages
XXIII, 685
Topics

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