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Bibliographic Information
Book Title: Advances in X-Ray Analysis
Book Subtitle: Volume 35B
Editors: C.S. Barrett, John V. Gilfrich, Ting C. Huang, Ron Jenkins, G.J. McCarthy, Paul K. Predecki, R. Ryon, … Deane K. Smith
Publisher: Springer New York, NY
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eBook Packages: Springer Book Archive
Copyright Information: Springer Science+Business Media New York 1992
Hardcover ISBN: 978-0-306-44249-0Published: 31 October 1992
Softcover ISBN: 978-1-4613-6532-7Published: 21 November 2012
Edition Number: 1
Number of Pages: IV, 641
Topics: Analytical Chemistry, Electrical Engineering, Characterization and Evaluation of Materials