Overview
- This text is the first to discuss, in detail, the development of traditional and second-generation frequency chains together with their enabling technology
- Extended up-to-date references
Part of the book series: Topics in Applied Physics (TAP, volume 79)
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Table of contents (14 chapters)
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Introduction
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Low-Noise and Ultrastable Secondary Frequency Standards
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Conventional Optical Frequency Measurement and Mid-Infrared Frequency Standards
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Advanced Optical Frequency Measurement and Synthesis
Keywords
About this book
Reviews
"FREQUENCY MEASUREMENT AND CONTROL is a valuable compilation of recent research results in the 'continued quest to improve the performance of oscillators.'...The book does a very good job of covering all the relevant issues involved in frequency locking, starting from materials sciences (the basics of frequency references), all the way to control theory (frequency locking, measurements, and synthesis). The authors skillfully guide the reader by suggesting background reading material, reviewing important research results and anticipating future developments that could be triggered, for example, by advances in materials science. Overall, the book is very well written and well suited to its target audience. It is a clear and well-organized reference, with a wealth of information and pointers to information."
-- OPTICS & PHOTONICS NEWS
Editors and Affiliations
Bibliographic Information
Book Title: Frequency Measurement and Control
Book Subtitle: Advanced Techniques and Future Trends
Editors: Andre N. Luiten
Series Title: Topics in Applied Physics
DOI: https://doi.org/10.1007/3-540-44991-4
Publisher: Springer Berlin, Heidelberg
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eBook Packages: Springer Book Archive
Copyright Information: Springer-Verlag Berlin Heidelberg 2001
Hardcover ISBN: 978-3-540-67694-2Published: 12 December 2000
Softcover ISBN: 978-3-662-30796-0Published: 23 August 2014
eBook ISBN: 978-3-540-44991-1Published: 01 July 2003
Series ISSN: 0303-4216
Series E-ISSN: 1437-0859
Edition Number: 1
Number of Pages: XIV, 397
Topics: Optics, Lasers, Photonics, Optical Devices, Solid State Physics, Spectroscopy and Microscopy, Engineering, general