Overview
- Scientific status report on scanning probe techniques
- Up-to-date information on the latest developments in scanning probe microscopy
- Also important for NEMS and BioNEMS
- Reference to researchers and graduate students in nanosciences
- Includes supplementary material: sn.pub/extras
Part of the book series: NanoScience and Technology (NANO)
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Table of contents (25 chapters)
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Front Matter
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Scanning Probe Microscopy Techniques
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Front Matter
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Characterization
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Front Matter
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Keywords
About this book
This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.
Editors and Affiliations
About the editor
Dr. Bharat Bhushan is an Ohio Eminent Scholar and The Howard D. Winbigler Professor in the Professor in the College of Engineering, and the Director of the Nanoprobe Laboratory for Bio- & Nanotechnology and Biomimetics (NLB2) at the Ohio State University, Columbus, Ohio. He holds two M.S., a Ph.D. in mechanical engineering/mechanics, an MBA, and three semi-honorary and honorary doctorates. His research interests include fundamental studies with a focus on scanning probe techniques in the interdisciplinary areas of bio/nanotribology, bio/nanomechanics and bio/nanomaterials characterization, and applications to bio/nanotechnology and biomimetics. He has authored 6 scientific books, more than 90 handbook chapters, more than 700 scientific papers (h factor – 42+), and more than 60 scientific reports, edited more than 45 books, and holds 17 U.S. and foreign patents. He is co-editor of Springer NanoScience and Technology Series and Microsystem Technologies. He has organized various international conferences and workshops. He is the recipient of numerous prestigious awards and international fellowships including the Alexander von Humboldt Research Prize for Senior Scientists, Max Planck Foundation Research Award for Outstanding Foreign Scientists, and the Fulbright Senior Scholar Award. He is a member of various professional societies, including the International Academy of Engineering (Russia). He has previously worked for various research labs including IBM Almaden Research Center, San Jose, CA. He has held visiting professor appointments at University of California at Berkeley, University of Cambridge, UK, Technical University Vienna, Austria, University of Paris, Orsay, ETH Zurich and EPFL Lausanne.
Bibliographic Information
Book Title: Scanning Probe Microscopy in Nanoscience and Nanotechnology 2
Editors: Bharat Bhushan
Series Title: NanoScience and Technology
DOI: https://doi.org/10.1007/978-3-642-10497-8
Publisher: Springer Berlin, Heidelberg
eBook Packages: Chemistry and Materials Science, Chemistry and Material Science (R0)
Copyright Information: Springer-Verlag Berlin Heidelberg 2011
Hardcover ISBN: 978-3-642-10496-1Published: 10 January 2011
Softcover ISBN: 978-3-662-50601-1Published: 23 August 2016
eBook ISBN: 978-3-642-10497-8Published: 17 December 2010
Series ISSN: 1434-4904
Series E-ISSN: 2197-7127
Edition Number: 1
Number of Pages: XXVI, 816
Topics: Nanotechnology, Characterization and Evaluation of Materials, Surfaces and Interfaces, Thin Films, Nanotechnology and Microengineering, Condensed Matter Physics, Biological and Medical Physics, Biophysics