Near Field Optics

1. Front Matter

   Pages i-xiv

   PDF

2. Introduction

   1. Some Remarks on the History of Near-Field Optics

      • D. W. Pohl

      Pages 1-5

3. Screened Tip Techniques

   1. Principles and Applications of Near-Field Scanning Optical Microscopy (NSOM)

      • E. Betzig

      Pages 7-15

   2. Near Field Optical and Exciton Imaging, Spectroscopy and Chemical Sensors

      • Raoul Kopelman, Weihong Tan, Zhong-You Shi, Duane Birnbaum

      Pages 17-24

   3. Amplitude, Phase Contrast, and Polarization Imaging in Near-Field Scanning Optical Microscopy

      • M. Vaez-Iravani, R. Toledo-Crow

      Pages 25-34

   4. A Scanning Near-Field Optical Microscope (SNOM) for Biological Applications

      • T. Hartmann, R. Gatz, W. Wiegräbe, A. Kramer, A. Hillebrand, K. Lieberman et al.

      Pages 35-44

   5. Reflection Shear Force/Near-Field Scanning Optical Microscopy (NSOM)

      • P. J. Moyer, M. A. Paesler

      Pages 45-50

   6. Optical Tunneling through an Adjustable Liquid Metal Gap

      • D. W. Pohl, D. Courjon, C. Bainier, A. Dereux, H. Heinzelmann

      Pages 51-58

4. Unscreened Tip Techniques

   1. Recent Experimental Results with the PSTM: - Observation of a Step on a Quartz Surface. - Spatial Spectroscopy of Microwaveguides

      • F. De Fornel, E. Bourillot, P. Adam, L. Salomon, G. Chabrier, J. P. Goudonnet

      Pages 59-70

   2. Combination of a Fiber and a Silicon Nitride Tip as a Bifunctional Detector; First Results and Perspectives

      • F. Baida, D. Courjon, G. Tribillon

      Pages 71-78

   3. Combined Photon Scanning Tunneling Microscope and Atomic Force Microscope using Silicon Nitride Probes

      • M. H. P. Moers, R. G. Tack, O. F. J. Noordman, F. B. Segerink, N. F. v. Hulst, B. Bölger

      Pages 79-86

   4. The Reflection Near Field Optical Microscope: An Alternative to STOM

      • M. Spajer, A. Jalocha

      Pages 87-96

   5. Scanning Tunneling Optical Microscopy: Application to very Low Relief Objects

      • C. Bainier, S. Leblanc, D. Courjon

      Pages 97-104

   6. Quantum Optical Picture of Photon STM and Proposal of Single Atom Manipulation

      • Hirokazu Hori

      Pages 105-114

   7. Low Temperature Photon Scanning Tunneling Microscope

      • C. L. Jahncke, M. A. Paesler

      Pages 115-120

5. Optical Forces

   1. Light Forces on Dielectric Particles and Atoms

      • Othmar Marti, Victor I. Balykin

      Pages 121-130

   2. Nanometer Resolution Photon STM and Single Atom Manipulation

      • M. Ohtsu, S. Jiang, T. Pangaribuan, M. Kozuma

      Pages 131-139

   3. Scanned Probe Optical Microscopy using a Non-Intrusive Probe

      • Lars Malmqvist, Hans M. Hertz

      Pages 141-146

6. Theory

   1. Theory of Evanescent and Radiative Fields

      • J. P. Vigneron

      Pages 147-156

   2. Theoretical Problems in Scanning Near-Field Optical Microscopy

      • D. van Labeke, D. Barchiesi

      Pages 157-178

Scanning near-field optical microscopy (SNOM, also known as NSOM) is a new local probe technique with a resolving power of 10--50 nm. Not being limited by diffraction, near-field optics (NFO) opens new perspectives for optical characterization and the understanding of optical phenomena, in particular in biology, microelectronics and materials science.
SNOM, after first demonstrations in '83/'84, has undergone a rapid development in the past two to four years. The increased interest has been largely stimulated by the wealth of optical properties that can be investigated and the growing importance of characterization on the nanometer scale in general. Examples include the use of fluorescence, birefrigence and plasmon effects for applications in particular in biology, microelectronics and materials science, to name just a few.
This volume emerged from the first international meeting devoted exclusively to NFO, and comprises a complete survey of the 1992 activities in the field, in particular the variety of instrumental techniques that are currently being explored, the demonstration of the imaging capabilities as well as theoretical interpretations - a highly nontrivial task. The comprehensive collection of papers devoted to these and related subjects make the book a valuable tool for anybody interested in near-field optics.

• Apertur
• diffraction
• imaging
• microscopy
• optical properties
• optics

• IBM Research Division, Zurich Research Laboratory, Rüschlikon, Switzerland

  Dieter W. Pohl

• Laboratoire d’Optique P.M. Duffieux, Université de Franche-Comté, Besançon, France

  Daniel Courjon

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