Skip to main content
SpringerLink
Log in

Circuit Design for Reliability

  • Book
  • © 2015

Overview

Editors:
  1. Ricardo Reis

    1. Instituto de Informática, Universidade Federal do Rio Grande do Sul (UFRGS), Porto Alegre, Brazil

    View editor publications

    You can also search for this editor in PubMed   Google Scholar

  2. Yu Cao

    1. School of ECEE, Arizona State University, Tempe, USA

    View editor publications

    You can also search for this editor in PubMed   Google Scholar

  3. Gilson Wirth

    1. Instituto de Informática, Universidade Federal do Rio Grande do Sul (UFRGS), Porto Alegre, Brazil

    View editor publications

    You can also search for this editor in PubMed   Google Scholar

  • Provides comprehensive review on various reliability mechanisms at sub-45nm nodes
  • Describes practical modeling and characterization techniques for reliability
  • Includes thorough presentation of robust design techniques for major VLSI design units
  • Promotes physical understanding with first-principle simulations
  • Includes supplementary material: sn.pub/extras

This is a preview of subscription content, log in via an institution to check access.

Access this book

Log in via an institution
eBook USD 16.99 USD 84.99
Discount applied Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book USD 129.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book USD 109.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Other ways to access

Licence this eBook for your library

Institutional subscriptions

Table of contents (12 chapters)

  1. Front Matter

    Pages i-vi
    Download chapter PDF

  2. Introduction

    • Ricardo Reis, Yu Cao, Gilson Wirth
    Pages 1-4

  3. Recent Trends in Bias Temperature Instability

    • B. Kaczer, T. Grasser, J. Franco, M. Toledano-Luque, J. Roussel, M. Cho et al.
    Pages 5-19

  4. Charge Trapping Phenomena in MOSFETS: From Noise to Bias Temperature Instability

    • Gilson Wirth, Roberto da Silva
    Pages 21-46

  5. Atomistic Simulations on Reliability

    • Dragica Vasileska, Nabil Ashraf
    Pages 47-67

  6. On-Chip Characterization of Statistical Device Degradation

    • Takashi Sato, Hiromitsu Awano
    Pages 69-92

  7. Compact Modeling of BTI for Circuit Reliability Analysis

    • Ketul B. Sutaria, Jyothi B. Velamala, Athul Ramkumar, Yu Cao
    Pages 93-119

  8. Circuit Resilience Roadmap

    • Veit B. Kleeberger, Christian Weis, Ulf Schlichtmann, Norbert Wehn
    Pages 121-143

  9. Layout Aware Electromigration Analysis of Power/Ground Networks

    • Di-an Li, Malgorzata Marek-Sadowska, Sani R. Nassif
    Pages 145-173

  10. Power-Gating for Leakage Control and Beyond

    • Andrea Calimera, Alberto Macii, Enrico Macii, Massimo Poncino
    Pages 175-205

  11. Soft Error Rate and Fault Tolerance Techniques for FPGAs

    • Fernanda Kastensmidt, Ricardo Reis
    Pages 207-221

  12. Low Power Robust FinFET-Based SRAM Design in Scaled Technologies

    • Sumeet Kumar Gupta, Kaushik Roy
    Pages 223-253

  13. Variability-Aware Clock Design

    • Matthew R. Guthaus, Gustavo Wilke
    Pages 255-272
Back to top

Keywords

About this book

This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units.  The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management.

Editors and Affiliations

  • Instituto de Informática, Universidade Federal do Rio Grande do Sul (UFRGS), Porto Alegre, Brazil

    Ricardo Reis, Gilson Wirth

  • School of ECEE, Arizona State University, Tempe, USA

    Yu Cao

Bibliographic Information

  • Book Title: Circuit Design for Reliability

  • Editors: Ricardo Reis, Yu Cao, Gilson Wirth

  • DOI: https://doi.org/10.1007/978-1-4614-4078-9

  • Publisher: Springer New York, NY

  • eBook Packages: Engineering, Engineering (R0)

  • Copyright Information: Springer Science+Business Media New York 2015

  • Hardcover ISBN: 978-1-4614-4077-2Published: 08 November 2014

  • Softcover ISBN: 978-1-4939-4156-8Published: 22 September 2016

  • eBook ISBN: 978-1-4614-4078-9Published: 08 November 2014

  • Edition Number: 1

  • Number of Pages: VI, 272

  • Number of Illustrations: 58 b/w illustrations, 132 illustrations in colour

  • Topics: Circuits and Systems, Quality Control, Reliability, Safety and Risk, Computer-Aided Engineering (CAD, CAE) and Design

Publish with us

Policies and ethics

Back to top

Search

Navigation