Overview
- Editors:
-
-
Samuel H. Cohen
-
Development and Engineering Center, U.S. Army Natick Research, Natick, USA
-
Mona T. Bray
-
Development and Engineering Center, U.S. Army Natick Research, Natick, USA
-
Marcia L. Lightbody
-
Development and Engineering Center, U.S. Army Natick Research, Natick, USA
Access this book
Other ways to access
Table of contents (44 chapters)
-
Nanostructure of Materials
-
- Gerardo B. Amisola, Ralf Behrensmeier, James M. Galligan, Fred A. Otter, Fereydoon Namavar, Nadar M. Kalkhoran
Pages 181-188
-
- Amar S. Bhalla, Gargi Raina, Shiv K. Sharma
Pages 189-194
-
- G. Raina, R. W. Gauldie, S. K. Sharma, C. E. Helsley
Pages 195-201
-
- J. M. Perez, W. Rivera, C. Lin, R. C. Hyer, M. Green, S. C. Sharma et al.
Pages 203-210
-
- J. Krim, A. Dayo, C. Daly
Pages 211-215
-
- David C. Martin, Jaime R. Ojeda, J. Philip Anderson, Gopal Pingali
Pages 217-227
-
-
- Rajkumari Patil, D. H. Reneker
Pages 237-249
-
- G. C. Rutledge, D. Snétivy, G. J. Vancso
Pages 251-263
-
- Janos H. Fendler, Jianping Yang
Pages 265-269
-
- Tomasz Kowalewski, Michael A. Matchett, William E. Buhro
Pages 271-279
-
- Karl H. Guenther, Jean M. Bennett, Frank K. Urban III, Milad F. Tabet, Marc von Gunten, Ron Bevis et al.
Pages 281-299
-
Methodologies and Techniques
-
Front Matter
Pages 301-301
-
- Chris Daly, Jacqueline Krim
Pages 303-309
-
- Richard J. Colton, Eric I. Altman, Steven M. Hues
Pages 311-319
-
- Paul E. West, Renee Jobe, Tim Van Slambrouck
Pages 321-325
-
-
- John T. Woodward, Joseph A. Zasadzinski
Pages 339-345
-
-
- Timothy J. Bunning, Deborah L. Vezie, Peter D. Haaland, Hao Jiang, Pamela F. Lloyd, Edwin L. Thomas et al.
Pages 359-367
About this book
The first U. S. Army Natick Research, Development and Engineering Center Atomic Force/Scanning Tunneling Microscopy (AFM/STM) Symposium was held on lune 8-10, 1993 in Natick, Massachusetts. This book represents the compilation of the papers presented at the meeting. The purpose ofthis symposium was to provide a forum where scientists from a number of diverse fields could interact with one another and exchange ideas. The various topics inc1uded application of AFM/STM in material sciences, polymers, physics, biology and biotechnology, along with recent developments inc1uding new probe microscopies and frontiers in this exciting area. The meeting's format was designed to encourage communication between members of the general scientific community and those individuals who are at the cutting edge of AFM, STM and other probe microscopies. It immediately became clear that this conference enabled interdisciplinary interactions among researchers from academia, industry and government, and set the tone for future collaborations. Expert scientists from diverse scientific areas including physics, chemistry, biology, materials science and electronics were invited to participate in the symposium. The agenda of the meeting was divided into three major sessions. In the first session, Biological Nanostructure, topics ranged from AFM ofDNA to STM imagmg ofthe biomoleeule tubulin and bacterialluciferase to the AFM of starch polymer double helices to AFM imaging of food surfaces.
Reviews
`The editors have done a fine job assembling a variety of contributions of varied style, topics, and current relevance into a coherent whole. The quality of the images, typesetting are all excellent and the book is organized in a thoughtful way.'
Scanning